Datasheet

MY
19
MY
MYQ
·
MYH
MYK
Common Options (Order Separately)
Common Precautions
Models with built-in CR circuit for coil surge absorption MY@-CR
With CR Without CR
●Contact Reliability Test MY4Z-CBG
(Modified Allen Bradley Circuit)
Contact load: 5 VDC, 1 mA resistive load
Malfunction level: Contact resistance of 100 Ω
A
A’
C = 0.033 μF
R = 6.8 kΩ
282 V
80 V
4.12 ms
9.4 ms
200 AC
A
A’
A
A’
To digital
memory
scope
140 V
282 V
msec
2.5
200 AC
600 V
282 V
ms
2.5
200 AC
0
20
22
24
26
28
30
1 5 10 50 100 500 1,000
Number of operations (×10
4
operations)
Number of Relays: 20 (average value)
Current-carrying contact
Open contacts
Self-latching contacts
Closed contacts
Malfunction rate: λ
60
= 0.0046 × 10
-6
per operation
(switching frequency: 200 operations/ min.)
Contact resistance (mΩ)
Energized
Y
X
Z
X'
Z’
Y’
550
400
600
300
550
600
400
600
600
250
600
700
Unit: m/s
2
Not energized
Common Specifications for MY2, MY3, MY4, MY4Z, MY@-02, MY@F, and MY(S)
●Shock Malfunction
N = 20
Measurement: Shock was applied 3 times each in 6 directions along 3
axes with the Relay energized and not energized to check
the shock values that cause the Relay to malfunction.
Criteria: Non-energized: 200 m/s
2
,
Energized: 200 m/s
2
Shock direction