CONFOCAL LASER SCANNING MICROSCOPE TM OLS3100 NEW The name "LEXT" is formed from the words "Laser" and "Next," and means "next-generation 3D confocal laser microscopes".
Greater simplicity with higher precision: The next step in the evolution of three dimensional laser confocal metrology. LEXT minimizes manual operation, improving ease of use for everyone. Even a first-time user can operate the system like an expert, and obtain fast reliable measurement results. The system features not only improved functionality, but also an even higher level of measurement performance.
Welcome to the world of LEXT 3D 2
Automatic operation achieves speedy, high-precision output. Position and magnification settings Click New, Operation Navigator feature is an online wizard that guides the user in the operation of the LEXT 3D image capturing with one click automatically detecting upper and lower limits The operation navigator provides animations to guide the user through each step of microscopic observation.
Welcome to the world of LEXT 3D Image capturing Display, measurement and analysis Introducing the user to a new 3D world by providing a variety of image presentation patterns, high precision measurement and advanced analytical techniques A captured image is rendered to an ideal 3D image by using LEXT’s display capabilities.
Powerful 3D display facilitates measurement and analysis. Display ● Adjustable 3D image Filamentation electrode The angle of a 3D image can be now changed freely with the mouse by grabbing the image. In addition, the 3D image can be scaled up or down in 100 steps using the mouse wheel. This is done using a unique algorithm to prevent the quality of the enlarged image from deteriorating. The background color can now also be changed to improve the observation and contrast of the specimen.
Welcome to the world of LEXT 3D Stud bump ● A variety of 3D image presentation patterns Reverse face of a Si wafer A variety of 3D image presentation patterns are provided, including surface texture, real color, wired frame, etc. A 3D image can be rendered to make it more visually effective.
Versatile observation methods to handle a wide range of applic Display ● Brightfield observation Color information can be obtained from brightfield (color) observation. Therefore, brightfield observation can be used effectively to observe a flaw on a color filter or to locate the position of an area of corrosion on metal.
Welcome to the world of LEXT 3D ations. ● Split screen display An image observed in one observation mode and the same image observed in another observation mode can be displayed simultaneously during live observation. A target point can be located easily by observing a microscopic image with color information and a high-resolution LSM (Laser Scanning Microscope) image simultaneously.
World-class resolution and precision. ● World’s highest level of resolution Basic concept of a light path in the violet opt system The optical system designed exclusively for use with 408-nm laser light (violet opt system) prevents the occurrence of aberrations associated with the use of a short-wavelength light source, and brings the highest performance out of the 408-nm light source.
Welcome to the world of LEXT 3D ● Objective lens designed exclusively for LEXT Confocal Laser Scanning Microscope An apochromatic objective lens exclusively for Confocal Laser Scanning Microscope, which enables to improve the optical performance with a 408-nm laser light, was developed. This special objective lens developed with the world-class optical technology of Olympus has made possible the highest level of observational clarity and measurement accuracy at high magnifications.
Full range of measurement/analysis functions to meet virtually Spherocrystal of polyamide resin The image shown below is a three-dimensional image of a spherocrystal of an injection molded polyamide resin (PA66) product observed using the N-ARC method. Such a spiral-shaped higher-order structure is observed in the spherocrystal growth process after injection molding, although it is of rare occurrence.
Welcome to the world of LEXT 3D any requirement. Solder (after ion etching) Because solder is very soft, years of experience and know-how are required to make specimen preparations before observing the composition of solder under a microscope. Polished surface techniques using the ion etching method have made considerable progress in recent years. The image shown below is the surface of solder processed with the ion etching method.
Models to respond to individual needs. Motorized stage/OLS30-CS150AS ● Stitching (Tiling) function to allow the user to make measurements over a wider area Configuration with a motorized stage LEXT is equipped with the tiling function for integrating a multiple of images into a single image. An observational area up to 12.8 mm x 12.8 mm can be viewed as one image. Measurement can also be made by viewing a tiled image.
Welcome to the world of LEXT 3D Specifications Laser scan Laser Observation method Microscope stand Illumination Z stage Z revolving nosepiece Laser White light Vertical movement/Maximum height of specimen Stroke/Resolution/Repeatability — Objective lens Total magnification Field of view Optical zoom Stage * Manual stage/Motorized stage Frame memory Intensity/Height AF Dimensions Weight 56.
•OLYMPUS CORPORATION has obtained ISO9001/ISO14001. Specifications are subject to change without any obligation on the part of the manufacturer.
