Datasheet

TJA1028 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 4 — 25 July 2012 15 of 24
NXP Semiconductors
TJA1028
LIN transceiver with integrated voltage regulator
12. Test information
12.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q100 - Failure mechanism based stress test qualification for integrated
circuits, and is suitable for use in automotive applications.
Fig 8. LIN transceiver timing diagram
015aaa199
V
TXD
V
BAT
t
bit
t
bus(rec)(min)
V
th(rec)(max)
thresholds of
receiving node A
V
th(dom)(max)
V
th(rec)(min)
V
th(dom)(min)
t
rx_pdr
t
rx_pdf
t
rx_pdr
t
rx_pdf
t
bus(rec)(max)
t
bit
t
bit
thresholds of
receiving node B
output of receiving
node A
V
RXD
output of receiving
node B
V
RXD
t
bus(dom)(max)
t
bus(dom)(min)
LIN bus
signal