Datasheet
TJA1024 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 1 — 12 February 2015 16 of 25
NXP Semiconductors
TJA1024
Quad LIN 2.2A/SAE J2602 transceiver
12. Application information
12.1 Application diagram
12.2 ESD robustness according to LIN EMC test specification
ESD robustness (IEC 61000-4-2) has been tested by an external test house according to
the LIN EMC test specification (part of Conformance Test Specification Package for
LIN 2.1, October 10th, 2008). The test report is available on request.
(1) Master: C = 1 nF; slave: C = 220 pF
Fig 6. Application diagram
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