Datasheet

Table 28. Comparator with 8-bit DAC electrical specifications (continued)
Symbol Description Min. Typ. Max. Unit
V
AIN
Analog input voltage 0 0 - V
DDA
V
DDA
V
V
AIO
Analog input offset voltage, High-speed mode mV
-40 - 125 ℃ -25 ±1 25
V
AIO
Analog input offset voltage, Low-speed mode mV
-40 - 125 ℃ -40 ±4 40
t
DHSB
Propagation delay, High-speed mode
2
ns
-40 - 105 ℃ — 30 200
-40 - 125 ℃ 30 300
t
DLSB
Propagation delay, Low-speed mode
2
µs
-40 - 105 ℃ — 0.5 2
-40 - 125 ℃ — 0.5 3
t
DHSS
Propagation delay, High-speed mode
3
ns
-40 - 105 ℃ — 70 400
-40 - 125 ℃ — 70 500
t
DLSS
Propagation delay, Low-speed mode
3
µs
-40 - 105 ℃ — 1 5
-40 - 125 ℃ — 1 5
t
IDHS
Initialization delay, High-speed mode
4
μs
-40 - 125 ℃ — 1.5 3
t
IDLS
Initialization delay, Low-speed mode
4
μs
-40 - 125 ℃ — 10 30
V
HYST0
Analog comparator hysteresis, Hyst0 (V
AIO
) mV
-40 - 125 ℃ — 0 —
V
HYST1
Analog comparator hysteresis, Hyst1, High-speed
mode
mV
-40 - 125 ℃ — 16 66
Analog comparator hysteresis, Hyst1, Low-speed
mode
-40 - 125 ℃ — 11 40
V
HYST2
Analog comparator hysteresis, Hyst2, High-speed
mode
mV
-40 - 125 ℃ — 32 133
Analog comparator hysteresis, Hyst2, Low-speed
mode
-40 - 125 ℃ — 22 80
V
HYST3
Analog comparator hysteresis, Hyst3, High-speed
mode
mV
-40 - 125 ℃ — 48 200
Analog comparator hysteresis, Hyst3, Low-speed
mode
-40 - 125 ℃ — 33 120
Table continues on the next page...
ADC electrical specifications
S32K1xx Data Sheet, Rev. 4, 06/2017
38
Preliminary
NXP Semiconductors