Datasheet

PRTR5V0U2AX All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 3 — 15 May 2012 5 of 12
NXP Semiconductors
PRTR5V0U2AX
Ultra low capacitance double rail-to-rail ESD protection diode
Fig 3. ESD clamping test setup and waveforms
006aaa680
50 Ω
R
d
C
s
PRTR5V0U2AX
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
clamped +8 kV ESD voltage waveform
(IEC 61000-4-2 network), pin I/O to GND
unclamped 8 kV ESD pulse waveform
(IEC 61000-4-2 network)
clamped 8 kV ESD pulse waveform
(IEC 61000-4-2 network), pin I/O to GND
450 Ω
RG 223/U
50 Ω coax
ESD TESTER
IEC 61000-4-2 network
C
s
= 150 pF; R
d
= 330 Ω
4 GHz DIGITAL
OSCILLOSCOPE
10×
ATTENUATOR
DUT
Device
Under
Test
vertical scale = 10 A/div
horizontal scale = 15 ns/div
vertical scale = 10 V/div
horizontal scale = 100 ns/div
vertical scale = 10 A/div
horizontal scale = 15 ns/div
vertical scale = 10 V/div
horizontal scale = 100 ns/div