Datasheet

PESD5V0L1UA_UB_UL_1 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 01 — 17 June 2009 6 of 13
NXP Semiconductors
PESD5V0L1UA/UB/UL
Low capacitance unidirectional ESD protection diodes
Fig 5. ESD clamping test setup and waveforms
006aab566
50 Ω
R
Z
C
Z
DUT
(Device
Under
Test)
unclamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
clamped +8 kV ESD pulse waveform
(IEC 61000-4-2 network)
unclamped −8 kV ESD pulse waveform
(IEC 61000-4-2 network)
clamped −8 kV ESD voltage waveform
(IEC 61000-4-2 network)
450 Ω
RG 223/U
50 Ω coax
ESD TESTER
IEC 61000-4-2 network
C
Z
= 150 pF; R
Z
= 330 Ω
4 GHz DIGITAL
OSCILLOSCOPE
10×
ATTENUATOR
vertical scale = 10 A/div
horizontal scale = 15 ns/div
vertical scale = 10 A/div
horizontal scale = 15 ns/div
vertical scale = 6 V/div
horizontal scale = 100 ns/div
vertical scale = 6 V/div
horizontal scale = 100 ns/div
GND
GND
GND
GND