Datasheet

PESDXL4UF_G_W_4 © NXP B.V. 2008. All rights reserved.
Product data sheet Rev. 04 — 28 February 2008 9 of 17
NXP Semiconductors
PESDxL4UF/G/W
Low capacitance unidirectional quadruple ESD protection diode arrays
Fig 8. ESD clamping test setup and waveforms
006aab138
50 Ω
R
Z
C
Z
vertical scale = 200 V/div
horizontal scale = 50 ns/div
unclamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
clamped +1 kV ESD voltage waveform
(IEC 61000-4-2 network)
unclamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
clamped −1 kV ESD voltage waveform
(IEC 61000-4-2 network)
vertical scale = 200 V/div
horizontal scale = 50 ns/div
vertical scale = 5 V/div
horizontal scale = 50 ns/div
GND
GND
GND2
GND1
GND
450 Ω
RG 223/U
50 Ω coax
ESD TESTER
IEC 61000-4-2 network
C
Z
= 150 pF; R
Z
= 330 Ω
DIGITIZING
OSCILLOSCOPE
10×
ATTENUATOR
(1)
DUT
DEVICE
UNDER
TEST
vertical scale = 5 V/div
horizontal scale = 50 ns/div
(1): attenuator is only used for open
socket high voltage measurements
PESD5V0L4UF/G/W
PESD3V3L4UF/G/W