Datasheet

Table 9. GPIO rise/fall times (2.5 V range)
Parameter Symbol Drive strength
SIUL2_MSCRn[D
SE]
Slew
rate
Test
conditions
Typ Max Unit
IO output
transition
time, rise/fall
1
tpr 001 slow
fast
15 pF Cload
on pad
7.41/8.22
7.36/8.16
ns
010 slow
fast
3.30/3.74
2.76/3.38
011 slow
fast
3.44/3.04
2.75/2.55
100 slow
fast
4.05/3.54
3.56/2.97
101 slow
fast
3.39/2.93
2.72/2.47
111 slow
fast
2.31/2.03
1.80/1.75
1. Max condition for tpr: wcs model, 0.9 V vddi, 2.25 V ovdd, and 125 °C. Input transition time is 125 ps. Slow slew rate
means SIUL2_MSCRn[SRE] = ‘00’, fast slew rate means SIUL2_MSCRn[SRE] = ‘11’
Table 10. GPIO rise/fall times (3.3 V range)
Parameter Symbol Drive strength
SIUL2_MSCRn[D
SE]
Slew
rate
Test
conditions
Typ Max Unit
IO output
transition
time, rise/fall
1
tpr 001 slow
fast
15 pF Cload
on pad
7.75/8.45
7.65/8.39
ns
010 slow
fast
3.49/3.89
2.84/3.52
011 slow
fast
3.47/3.16
2.90/2.73
100 slow
fast
4.09/3.58
3.73/3.07
101 slow
fast
3.29/3.00
2.68/2.37
111 slow
fast
2.23/2.18
1.47/1.57
1. Max condition for tpr: wcs model, 0.9 V vddi, 2.97 V ovdd, and 125 °C. Input transition time is 120 ps.
slow slew rate means SIUL2_MSCRn[SRE] = ‘00’, fast slew rate means SIUL2_MSCRn[SRE] = ‘11’
General purpose I/O parameters
S32V234 Data Sheet, Rev. 8, 01/2019
16 NXP Semiconductors