Datasheet

NXP Semiconductors
UM11193
KITFS85AEEVM evaluation board
UM11193 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2020. All rights reserved.
User manual Rev. 2.1 — 30 January 2019
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8.4.10 TestMode:Mirrors_Main and TestMode:Mirrors_Failsafe
The TestModeMirrors_Main and TestModeMirrors_FailSafe tabs allow access to the OTP
main mirrors and fail-safe registers. These tabs are available in Test mode.
Figure 41. TestMode: Mirrors_Main