Datasheet

Electrical Characteristics
i.MX 6Dual/6Quad Automotive and Infotainment Applications Processors, Rev. 6, 11/2018
NXP Semiconductors 123
Figure 85. Boundary Scan (JTAG) Timing Diagram
Figure 86. Test Access Port Timing Diagram
JTAG_TCK
(Input)
Data
Inputs
Data
Outputs
Data
Outputs
Data
Outputs
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
SJ4
SJ5
SJ6
SJ7
SJ6
JTAG_TCK
(Input)
JTAG_TDI
(Input)
JTAG_TDO
(Output)
JTAG_TDO
(Output)
JTAG_TDO
(Output)
VIH
VIL
Input Data Valid
Output Data Valid
Output Data Valid
JTAG_TMS
SJ8 SJ9
SJ10
SJ11
SJ10