Datasheet

January 1995 7
Philips Semiconductors Product specification
Hex inverter
HEF4069UB
gates
Fig.12 Test set-up for measuring forward transconductance g
fs
=di
o
/dv
i
at v
o
is constant (see also graph
Fig.13).
Fig.13 Typical forward transconductance g
fs
as a function of the supply voltage at T
amb
=25°C.
A : average,
B : average + 2 s,
C : average − 2 s, where:
‘s’ is the observed standard
deviation.