Datasheet

BZX84J_SER All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 2 — 1 August 2011 8 of 13
NXP Semiconductors
BZX84J series
Single Zener diodes
8. Test information
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
T
j
=25C
BZX84J-B/C2V7 to BZX84J-B/C8V2
T
j
=25C
BZX84J-B/C10 to BZX84J-B/C36
Fig 5. Working current as a function of working
voltage; typical values
Fig 6. Working current as a function of working
voltage; typical values
V
Z
(V)
0108462
006aaa996
20
30
10
40
50
I
Z
(mA)
0
V
Z(nom)
(V) = 2.7
3.3
3.9
4.7
5.6 6.8 8.2
V
Z
(V)
0403010 20
006aaa997
10
20
30
5
15
25
I
Z
(mA)
0
V
Z(nom)
(V) = 10
36
33272218
12
15