Datasheet
BAT720 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 4 — 14 November 2012 4 of 10
NXP Semiconductors
BAT720
Schottky barrier diode
8. Test information
8.1 Quality information
This product has been qualified in accordance with the Automotive Electronics Council
(AEC) standard Q101 - Stress test qualification for discrete semiconductors, and is
suitable for use in automotive applications.
f=1MHz; T
amb
=25C
Fig 3. Diode capacitance as a function of reverse voltage; typical values
mbk577
4030
V
R
(V)
C
d
(pF)
01020
10
2
10
1