Datasheet

2003 Jun 30 9
Philips Semiconductors Product specification
Quad 2-input NAND gate 74HC00; 74HCT00
AC CHARACTERISTICS
Type 74HC00
GND = 0 V; t
r
=t
f
= 6 ns; C
L
=50pF.
Note
1. All typical values are measured at T
amb
=25°C.
Type 74HCT00
GND = 0 V; t
r
=t
f
= 6 ns; C
L
=50pF
Note
1. All typical values are measured at T
amb
=25°C.
SYMBOL PARAMETER
TEST CONDITIONS
MIN. TYP. MAX. UNIT
WAVEFORMS V
CC
(V)
T
amb
= −40 to +85 °C; note 1
t
PHL
/t
PLH
propagation delay nA, nB to nY see Fig.6 2.0 − 25 115 ns
see Fig.6 4.5 − 923ns
see Fig.6 6.0 − 720ns
t
THL
/t
TLH
output transition time 2.0 − 19 95 ns
4.5 − 719ns
6.0 − 616ns
T
amb
= −40 to +125 °C
t
PHL
/t
PLH
propagation delay nA, nB to nY see Fig.6 2.0 −−135 ns
see Fig.6 4.5 −−27 ns
see Fig.6 6.0 −−23 ns
t
THL
/t
TLH
output transition time 2.0 −−110 ns
4.5 −−22 ns
6.0 −−19 ns
SYMBOL PARAMETER
TEST CONDITIONS
MIN. TYP MAX. UNIT
WAVEFORMS V
CC
(V)
T
amb
= −40 to +85 °C; note 1
t
PHL
/t
PLH
propagation delay nA, nB to nY see Fig.6 4.5 − 12 24 ns
t
THL
/t
TLH
output transition time 4.5 −−29 ns
T
amb
= −40 to +125 °C
t
PHL
/t
PLH
propagation delay nA, nB to nY see Fig.6 4.5 −−29 ns
t
THL
/t
TLH
output transition time 4.5 −−22 ns