Datasheet

74AHC_AHCT1G00_6 © NXP B.V. 2007. All rights reserved.
Product data sheet Rev. 06 — 30 May 2007 6 of 11
NXP Semiconductors
74AHC1G00; 74AHCT1G00
2-input NAND gate
12. Waveforms
Measurement points are given in Table 9.
Fig 5. The inputs (A and B) to output (Y) propagation delays
mna106
A, B input
Y output
t
PHL
t
PLH
V
M
V
M
Table 9. Measurement point
Type Input Output
V
I
V
M
V
M
74AHC1G00 GND to V
CC
0.5 × V
CC
0.5 × V
CC
74AHCT1G00 GND to 3.0 V 1.5 V 0.5 × V
CC
Test data is given in Table 8. Definitions for test circuit:
C
L
= Load capacitance including jig and probe capacitance.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
Fig 6. Load circuitry for switching times
mna101
V
CC
V
I
V
O
R
T
C
L
PULSE
GENERATOR
DUT