Datasheet
TJA1055 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 5 — 6 December 2013 15 of 26
NXP Semiconductors
TJA1055
Enhanced fault-tolerant CAN transceiver
[1] All parameters are guaranteed over the virtual junction temperature range by design, but only 100 % tested at T
amb
= 125 C for dies on
wafer level, and above this for cased products 100 % tested at T
amb
=25C, unless otherwise specified.
[2] To guarantee a successful mode transition under all conditions, the maximum specified time must be applied.
t
dom(CANH)
dominant time on pin CANH low power modes; V
BAT
=14V
[2]
7- 38s
t
dom(CANL)
dominant time on pin CANL low power modes; V
BAT
=14V
[2]
7- 38s
t
WAKE
local wake-up time on pin WAKE low power modes; V
BAT
= 14 V; for wake-up
after receiving a falling or rising edge
[2]
7- 38s
t
det
failure detection time normal operating mode
failures 3 and 3a 1.6 - 8.0 ms
failures 4, 6 and 7 0.3 - 1.6 ms
low power modes; V
BAT
=14V
failures 3 and 3a 1.6 - 8.0 ms
failures 4 and 7 0.1 - 1.6 ms
t
rec
failure recovery time normal operating mode
failures 3 and 3a 0.3 - 1.6 ms
failures 4 and 7 7 - 38 s
failure 6 125 - 750 s
low power modes; V
BAT
=14V
failures 3, 3a, 4 and 7 0.3 - 1.6 ms
n
det
pulse-count failure detection difference between CANH and CANL;
normal operating mode and failures 1, 2, 5
and 6a; pin ERR
becomes LOW
-4-
n
rec
number of consecutive pulses for
failure recovery
on CANH and CANL simultaneously;
failures 1, 2, 5 and 6a
-4-
Table 9. Dynamic characteristics
…continued
V
CC
= 4.75 V to 5.25 V; V
BAT
= 5.0 V to 40 V; V
STB
=V
CC
; T
vj
=
40
C to +150
C; R
CAN_L
=R
CAN_H
= 125
; C
CAN_L
=
C
CAN_H
= 1 nF; all voltages are defined with respect to ground; unless otherwise specified.
[1]
Symbol Parameter Conditions Min Typ Max Unit