Datasheet
PCA8565 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 4 — 5 December 2014 28 of 48
NXP Semiconductors
PCA8565
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12. Limiting values
[1] Pass level; Human Body Model (HBM) according to Ref. 6 “JESD22-A114”.
[2] Pass level; Charged-Device Model (CDM), according to Ref. 7 “
JESD22-C101”.
[3] Pass level; latch-up testing, according to Ref. 8 “
JESD78”.
[4] According to the store and transport requirements (see Ref. 14 “
UM10569”) the devices have to be stored
at a temperature of +8 C to +45 C and a humidity of 25 % to 75 %.
Table 31. Limiting values
In accordance with the Absolute Maximum Rating System (IEC 60134).
Symbol Parameter Conditions Min Max Unit
V
DD
supply voltage 0.5 +6.5 V
I
SS
ground supply current 50 +50 mA
I
DD
supply current 50 +50 mA
V
I
input voltage 0.5 +6.5 V
I
I
input current 10 +10 mA
I
O
output current 10 +10 mA
P
tot
total power dissipation - 300 mW
V
ESD
electrostatic discharge
voltage
HBM
[1]
- 3000 V
CDM
[2]
- 1100 V
I
lu
latch-up current
[3]
- 250 mA
T
stg
storage temperature
[4]
65 +150 C
T
amb
ambient temperature 40 +125 C