Datasheet

NX3L1T53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 23 January 2013 13 of 24
NXP Semiconductors
NX3L1T53
Low-ohmic single-pole double-throw analog switch
a. Test circuit
b. Input and output measurement points
Fig 17. Test circuit for measuring break-before-make timing
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R
L
S
GND
E
Z
Y0
V
IL
Y1
V
CC
V
I
C
L
G
V
V
O
V
EXT
= 1.5 V
001aag572
V
I
t
b-m
V
O
0.9V
O
0.9V
O
0.5V
I
Test data is given in Table 11.
Definitions test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
V
EXT
= External voltage for measuring switching times.
V
I
may be connected to S or E.
Fig 18. Test circuit for measuring switching times
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R
L
S
GND
E
Z
Y0
V
IL
Y1
V
CC
V
I
C
L
G
V
V
O
V
EXT
= 1.5 V
switch
1
2