Datasheet

NX3L1T53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 23 January 2013 17 of 24
NXP Semiconductors
NX3L1T53
Low-ohmic single-pole double-throw analog switch
a. Test circuit
b. Input and output pulse definitions
Q
inj
= V
O
 C
L
.
V
O
= output voltage variation.
R
gen
= generator resistance.
V
gen
= generator voltage.
V
I
may be connected to S or E.
Fig 24. Test circuit for measuring charge injection
001aad398
S
Z
Y0
Y1
R
L
C
L
V
CC
GND
R
gen
V
gen
switch
1
2
V
I
V
O
E
V
IL
G
001aah451
ΔV
O
off offon
V
O
logic input
(S, E)