Datasheet

NX3L1T53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 23 January 2013 16 of 24
NXP Semiconductors
NX3L1T53
Low-ohmic single-pole double-throw analog switch
a. Test circuit
b. Input and output pulse definitions
V
I
may be connected to S or E.
Fig 22. Test circuit for measuring crosstalk voltage between digital inputs and switch
V
001aah452
R
L
S
E
Z
Y0
V
IL
or V
IH
Y1
V
CC
V
I
V
O
logic
input
0.5V
CC
R
L
C
L
0.5V
CC
G
V
ct
onoff
logic input
(S, E)
off
V
O
001aah453
Fig 23. Test circuit for measuring crosstalk
S
E
Z
Y0
V
IL
or V
IH
V
CC
0.5V
CC
V
IH
dB
001aah463
Y1
GND
1
2
R
L
f
i
0.5V
CC
R
L