Datasheet

NX3L1T53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 8 — 23 January 2013 15 of 24
NXP Semiconductors
NX3L1T53
Low-ohmic single-pole double-throw analog switch
12.3 Test circuits
Fig 19. Test circuit for measuring total harmonic distortion
S
E
Z
Y0
V
IL
or V
IH
V
CC
0.5V
CC
V
IL
switch
1
2V
IH
V
IL
S
V
IL
V
IL
E
f
i
D
001aah460
Y1
switch
GND
1
2
R
L
Adjust f
i
voltage to obtain 0 dBm level at output. Increase f
i
frequency until dB meter reads 3dB.
Fig 20. Test circuit for measuring the frequency response when switch is in ON-state
S
E
Z
Y0
V
IL
or V
IH
V
CC
0.5V
CC
V
IL
switch
1
2V
IH
V
IL
S
V
IL
V
IL
E
f
i
dB
001aah461
Y1
switch
GND
1
2
R
L
Adjust f
i
voltage to obtain 0 dBm level at input.
Fig 21. Test circuit for measuring isolation (OFF-state)
S
E
Z
Y0
V
IL
or V
IH
V
CC
0.5V
CC
V
IH
switch
1
2V
IL
V
IH
S
V
IH
V
IH
E
f
i
dB
001aah462
Y1
switch
GND
1
2
R
L
0.5V
CC
R
L