Datasheet

NX3L1G384 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 6 — 3 July 2012 12 of 18
NXP Semiconductors
NX3L1G384
Low-ohmic single-pole single-throw analog switch
a. Test circuit
b. Input and output pulse definitions
Definition: Q
inj
= V
O
 C
L
.
V
O
= output voltage variation.
R
gen
= generator resistance.
V
gen
= generator voltage.
Fig 21. Test circuit for measuring charge injection
VV
O
001aai607
C
L
R
L
R
gen
Y/Z Z/Y
E
V
CC
GND
V
gen
G
V
I
001aai608
V
O
offonoff
V
O
logic
input (E)