Datasheet

NX3L1G384 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 6 — 3 July 2012 11 of 18
NXP Semiconductors
NX3L1G384
Low-ohmic single-pole single-throw analog switch
Adjust f
i
voltage to obtain 0 dBm level at output. Increase f
i
frequency until dB meter reads 3dB.
Fig 18. Test circuit for measuring the frequency response when channel is in ON-state
dB
001aai603
Y/Z
E
V
IL
f
i
R
L
Z/Y
V
CC
0.5V
CC
Adjust f
i
voltage to obtain 0 dBm level at input.
Fig 19. Test circuit for measuring isolation (OFF-state)
dB
001aai604
Y/Z
E
V
IH
f
i
R
L
Z/Y
V
CC
0.5V
CC
R
L
0.5V
CC
a. Test circuit
b. Input and output pulse definitions
Fig 20. Test circuit for measuring crosstalk voltage between digital inputs and switch
VV
O
001aai605
R
L
C
L
R
L
V
I
Y/Z Z/Y
E
V
CC
0.5V
CC
0.5V
CC
G
001aai606
on offoff
logic
input (E)
V
O
V
ct