Datasheet

NX3L1G3157 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 7 August 2012 6 of 22
NXP Semiconductors
NX3L1G3157
Low-ohmic single-pole double-throw analog switch
11.1 Test circuits
V
I
=0.3VorV
CC
 0.3 V; V
O
=V
CC
 0.3 V or 0.3 V.
Fig 5. Test circuit for measuring OFF-state leakage current
I
S
001aac358
S
Z
Y0
Y1
V
CC
GND
switch
switch
1
1
2
2
V
IL
V
IH
S
V
IL
or V
IH
V
I
V
O
V
I
=0.3VorV
CC
 0.3 V; V
O
=V
CC
 0.3 V or 0.3 V.
Fig 6. Test circuit for measuring ON-state leakage current
I
S
001aac359
S
Z
Y0
Y1
V
CC
GND
switch
switch
1
1
2
2
V
IL
V
IH
S
V
O
V
IL
or V
IH
V
I