Datasheet

NX3L1G3157 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 7 August 2012 16 of 22
NXP Semiconductors
NX3L1G3157
Low-ohmic single-pole double-throw analog switch
a. Test circuit
b. Input and output pulse definitions
Definition: Q
inj
= V
O
 C
L
.
V
O
= output voltage variation.
R
gen
= generator resistance.
V
gen
= generator voltage.
Fig 22. Test circuit for measuring charge injection
001aac366
S
Z
Y0
Y1
R
L
V
I
C
L
V
CC
GND
R
gen
V
gen
switch
1
2
V
O
G
001aac478
ΔV
O
offonoff
logic
input
V
O
(S)