Datasheet

NX3L1G3157 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 7 August 2012 15 of 22
NXP Semiconductors
NX3L1G3157
Low-ohmic single-pole double-throw analog switch
a. Test circuit
b. Input and output pulse definitions
Fig 21. Test circuit for measuring crosstalk voltage between digital inputs and switch
V
001aah442
R
L
switch
1
2V
IH
V
IL
S
S
Z
Y0
Y1
V
CC
V
I
V
O
logic
input
0.5V
CC
R
L
C
L
0.5V
CC
switch
1
2
G
V
ct
onoff
logic
input (S)
off
V
O
001aah443