Datasheet

NX3L1G3157 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 10 — 7 August 2012 12 of 22
NXP Semiconductors
NX3L1G3157
Low-ohmic single-pole double-throw analog switch
a. Test circuit
b. Input and output measurement points
Fig 16. Test circuit for measuring break-before-make timing
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GND
V
CC
V
EXT
= 1.5 V
Y0
Y1
S
Z
V
I
V
V
O
R
L
C
L
G
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V
I
t
b-m
V
O
0.9V
O
0.9V
O
0.5V
I
Test data is given in Table 11.
Definitions test circuit:
R
L
= Load resistance.
C
L
= Load capacitance including jig and probe capacitance.
V
EXT
= External voltage for measuring switching times.
Fig 17. Load circuit for switching times
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S
Z
Y0
Y1
R
L
C
L
V
CC
GND
V
EXT
= 1.5 V
switch
1
2
V
I
V
V
O
G
Table 11. Test data
Supply voltage Input Load
V
CC
V
I
t
r
, t
f
C
L
R
L
1.4 V to 4.3 V V
CC
 2.5ns 35pF 50