Datasheet

Table Of Contents
Electrical Characteristics
33-26 Freescale Semiconductor
Figure 33-16. Test Clock Input Timing
Figure 33-17. Boundary Scan (JTAG) Timing
Figure 33-18. Test Access Port Timing
TCLK
V
IL
V
IH
33
44
2
(input)
Input Data Valid
Output Data Valid
Output Data Valid
TCLK
Data Inputs
Data Outputs
Data Outputs
Data Outputs
V
IL
V
IH
56
7
8
7
Input Data Valid
Output Data Valid
Output Data Valid
TCLK
TDI
TDO
TDO
TDO
TMS
V
IL
V
IH
910
11
12
11
BKPT
MCF5282 and MCF5216 ColdFire Microcontroller User’s Manual, Rev. 3