Datasheet

Signal Descriptions
Freescale Semiconductor 14-7
Table 14-2 lists signals in alphabetical order by abbreviated name.
Development serial
input/Test data
DSI/TDI Provides single-bit communication for
debug module commands (DSI).
Provides serial data port for loading
JTAG boundary scan, bypass, and
instruction registers (TDI).
I 14-30
Development serial
output/Test data
DSO/TDO Provides single-bit communication for
debug module responses (DSO).
Provides serial data port for outputting
JTAG logic data (TDO).
O 14-30
Test clock TCLK JTAG test logic clock. I 14-30
Debug data DDATA[3:0] Display captured processor
addresses, data, and breakpoint
status.
O 14-31
Processor status
outputs
PST[3:0] Indicate core status. O 14-31
Test Signals
Test TEST Reserved, should be connected to
VSS.
I 14-31
Power and Reference Signals
QADC analog reference VRH, VRL High (VRH) and low (VRL) reference
potentials for the analog converter.
Ground 14-32
QADC analog supply VDDA, VSSA Isolate the QADC analog circuitry from
digital power supply noise.
I 14-32
PLL analog supply VDDPLL, VSSPLL Isolate the PLL analog circuitry from
digital power supply noise.
I 14-32
QADC positive supply VDDH Supplies positive power to the ESD
structures in the QADC pads.
I 14-32
Flash erase/program
power
VPP Used for Flash stress testing. I 14-32
Flash array power
and ground
VDDF, VSSF Supply power and ground to Flash
array.
I 14-32
Standby power VSTBY Provides standby voltage to RAM array
if VDD is lost.
I 14-32
Positive supply VDD Supplies positive power to the core
logic and I/O pads.
I 14-32
Ground VSS Negative supply. 14-32
Table 14-1. MCF5282 Signal Description (continued)
Signal Name Abbreviation Function I/O Page
MCF5282 and MCF5216 ColdFire Microcontroller User’s Manual, Rev. 3