Datasheet

MC9S08QE32 Series MCU Data Sheet, Rev. 7
Electrical Characteristics
Freescale Semiconductor28
P
Conversion
time (including
sample time)
Short sample (ADLSMP = 0)
t
ADC
—20 —
ADCK
cycles
See
reference
manual for
conversion
time
variances
Long sample (ADLSMP = 1) — 40 —
P Sample time
Short sample (ADLSMP = 0)
t
ADS
—3.5 —
ADCK
cycles
Long sample (ADLSMP = 1) — 23.5 —
D
Temp sensor
slope
–40 C– 25 C
m
— 1.646 —
mV/C
25 C– 85 C — 1.769 —
D
Temp sensor
voltage
25 CV
TEMP25
— 701.2 — mV
T
Tota l
unadjusted
error
12-bit mode, 3.6> V
DDAD
> 2.7
E
TUE
— –1 to 3 –2.5 to 5.5
LSB
2
Includes
quantization
T
12-bit mode, 2.7> V
DDAD
>
1.8V
— –1 to 3 –3.0 to 6.5
P 10-bit mode — 1 2.5
P 8-bit mode — 0.5 1.0
T
Differential
non-linearity
12-bit mode
DNL
— 1.0 –1.5 to 2.0
LSB
2
P 10-bit mode
3
— 0.5 1.0
P 8-bit mode
3
— 0.3 0.5
T
Integral
non-linearity
12-bit mode
INL
— 1.5
–2.5 to
2.75
LSB
2
T 10-bit mode — 0.5 1.0
T 8-bit mode — 0.3 0.5
T
Zero-scale
error
12-bit mode
E
ZS
— 1.5 2.5
LSB
2
V
ADIN
=
V
SSAD
P 10-bit mode — 0.5 1.5
P 8-bit mode — 0.5 0.5
T
Full-scale error
12-bit mode
E
FS
— 1.0 –3.5 to 1.0
LSB
2
V
ADIN
=
V
DDAD
P 10-bit mode — 0.5 1
P 8-bit mode — 0.5 0.5
D
Quantization
error
12-bit mode
E
Q
— –1 to 0 —
LSB
2
10-bit mode — — 0.5
8-bit mode — — 0.5
D
Input leakage
error
12-bit mode
E
IL
— 2—
LSB
2
Pad
leakage
4
*
R
AS
10-bit mode — 0.2 4
8-bit mode — 0.1 1.2
Table 17. ADC Characteristics (V
REFH
= V
DDAD
, V
REFL
= V
SSAD
) (continued)
C Characteristic Conditions Symbol Min Typ
1
Max Unit Comment