Datasheet

MC9S08LL16 Series MCU Data Sheet, Rev. 7
Electrical Characteristics
Freescale Semiconductor40
3.15 EMC Performance
Electromagnetic compatibility (EMC) performance is highly dependant on the environment in which the
MCU resides. Board design and layout, circuit topology choices, location and characteristics of external
components as well as MCU software operation all play a significant role in EMC performance. The
system designer should consult Freescale applications notes such as AN2321, AN1050, AN1263,
AN2764, and AN1259 for advice and guidance specifically targeted at optimizing EMC performance.
3.15.1 Radiated Emissions
Microcontroller radiated RF emissions are measured from 150 kHz to 1 GHz using the TEM/GTEM Cell
method in accordance with the IEC 61967-2 and SAE J1752/3 standards. The measurement is performed
with the microcontroller installed on a custom EMC evaluation board while running specialized EMC test
software. The radiated emissions from the microcontroller are measured in a TEM cell in two package
orientations (North and East).
Table 20. Flash Characteristics
C Characteristic Symbol Min Typical Max Unit
D
Supply voltage for program/erase
-40°C to 85°CV
prog/erase
1.8 3.6 V
D Supply voltage for read operation V
Read
1.8 3.6 V
D Internal FCLK frequency
1
1
The frequency of this clock is controlled by a software setting.
f
FCLK
150 200 kHz
D Internal FCLK period (1/FCLK) t
Fcyc
56.67μs
P Byte program time (random location)
2
t
prog
9t
Fcyc
P Byte program time (burst mode)
2
t
Burst
4t
Fcyc
P Page erase time
2
2
These values are hardware state machine controlled. User code does not need to count cycles. This information supplied
for calculating approximate time to program and erase.
t
Page
4000 t
Fcyc
P Mass erase time
2
t
Mass
20,000 t
Fcyc
D Byte program current
3
3
The program and erase currents are additional to the standard run I
DD
. These values are measured at room temperatures
with V
DD
= 3.0 V, bus frequency = 4.0 MHz.
RI
DDBP
—4—mA
D Page erase current
3
RI
DDPE
—6—mA
C
Program/erase endurance
4
T
L
to T
H
= –40°C to + 85°C
T = 25°C
4
Typical endurance for FLASH was evaluated for this product family on the 9S12Dx64. For additional information on how
Freescale defines typical endurance, please refer to Engineering Bulletin EB619, Typical Endurance for Nonvolatile
Memory.
10,000 —
100,000
—
—
cycles
C Data retention
5
5
Typical data retention values are based on intrinsic capability of the technology measured at high temperature and de-rated
to 25°C using the Arrhenius equation. For additional information on how Freescale defines typical data retention, please
refer to Engineering Bulletin EB618, Typical Data Retention for Nonvolatile Memory.
t
D_ret
15 100 — years