Datasheet

LPC2101_02_03_4 © NXP B.V. 2009. All rights reserved.
Product data sheet Rev. 04 — 2 June 2009 28 of 37
NXP Semiconductors
LPC2101/02/03
Single-chip 16-bit/32-bit microcontrollers
Test conditions: Deep power-down mode entered; RTC off; SRAM off; V
DD(3V3)
= 3.3 V;
V
DD(1V8)
= 1.8 V; V
i(BAT)
=V
DDA
= 3.3 V.
Fig 8. I/O supply current I
DD(IO)
measured at different temperatures
002aae682
Temperature (°C)
−40 853510 60−15
0.05
0.15
0.10
0.20
I
DD(IO)
(µA)
0