Datasheet

HEF4066B_6 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 06 — 25 March 2010 8 of 16
NXP Semiconductors
HEF4066B
Quad single-pole single-throw analog switch
11.2 Additional dynamic parameters
Test data is given in Table 11.
Definitions:
DUT = Device Under Test.
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including test jig and probe.
R
L
= Load resistance.
Fig 9. Test circuit for measuring switching times
V
M
V
M
t
W
t
W
10 %
90 %
0 V
V
I
V
I
negative
pulse
positive
pulse
0 V
V
M
V
M
90 %
10 %
t
f
t
r
t
r
t
f
001aak67
4
V
DD
V
SS
V
DD
V
I
V
O
open
DUT
C
L
S1
R
T
R
L
V
I
G
Table 11. Test data
Supply voltage Input Load S1 position
V
DD
V
I
t
r
, t
f
C
L
R
L
t
PHL
, t
PLH
t
PZH
, t
PHZ
t
PZL
, t
PLZ
5 V to 15 V 0 V or V
DD
≤ 20 ns 50 pF 10 kΩ V
SS
V
SS
V
DD
Table 12. Additional dynamic characteristics
V
SS
= 0 V; T
amb
= 25 ° C.
Symbol Parameter Conditions V
DD
Typ Max Unit
THD total harmonic distortion see Figure 10
; R
L
=10kΩ; C
L
=15pF;
channel ON; V
I
=0.5V
DD
(p-p);
f
i
=1kHz
5V
[1]
0.25 - %
10 V
[1]
0.04 - %
15 V
[1]
0.04 - %
V
ct
crosstalk voltage nE input to switch; see Figure 11;
R
L
= 10 kΩ; C
L
=15pF;
nE = V
DD
(square-wave)
10 V 50 - mV