Datasheet
HEF4052B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 9 — 11 September 2014 14 of 22
NXP Semiconductors
HEF4052B
Dual 4-channel analog multiplexer/demultiplexer
Fig 19. Test circuit for measuring isolation (OFF-state)
dB
001aak657
V
SS
f
i
R
L
C
L
switch
V
SS
= V
EE
S1 and S2
E
nZ
nY0
V
DD
or V
SS
V
DD
nYn
1
2
a. Test circuit
b. Input and output pulse definitions
Fig 20. Test circuit for measuring crosstalk voltage between digital inputs and switch
DDN
9
''
RU9
66
9
''
VZLWFK
9
66
9
((
6DQG6
(
Q=
Q<
9
''
Q<Q
*
9
5
/
9
''
5
/
&
/
9
2
DDM
RQ
9
2
9
FW
RIIRII
ORJLF
LQSXW6Q(