Datasheet

HEF4051B All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 11 — 11 September 2014 8 of 23
NXP Semiconductors
HEF4051B
8-channel analog multiplexer/demultiplexer
10.1 Test circuits
I
S(OFF)
OFF-state
leakage
current
Z port;
all channels OFF;
see Figure 9
15 V - - - 1000 - - - - nA
Y port;
per channel;
see Figure 10
15 V - - - 200 - - - - nA
I
DD
supply current I
O
= 0 A 5 V - 5 - 5 - 150 - 150 A
10 V - 10 - 10 - 300 - 300 A
15 V - 20 - 20 - 600 - 600 A
C
I
input
capacitance
Sn, E inputs - - - - 7.5 - - - - pF
Table 6. Static characteristics
…continued
V
SS
= V
EE
= 0 V; V
I
= V
SS
or V
DD
unless otherwise specified.
Symbol Parameter Conditions V
DD
T
amb
= 40 C T
amb
= 25 C T
amb
= 85 C T
amb
= 125 C Unit
Min Max Min Max Min Max Min Max
Fig 9. Test circuit for measuring OFF-state leakage current Z port
I
S
001aak513
V
DD
V
I
V
SS
= V
EE
S1 to S3
E
Z
V
DD
or V
SS
V
DD
Yn
V
O
Fig 10. Test circuit for measuring OFF-state leakage current Yn port
I
S
001aak514
V
SS
V
O
switch
V
SS
= V
EE
S1 to S3
E
Z
Y0
V
DD
or V
SS
V
DD
Yn
1
2
V
I