Datasheet
BGA7127 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2010. All rights reserved.
Product data sheet Rev. 3 — 3 December 2010 7 of 25
NXP Semiconductors
BGA7127
400 MHz to 2700 MHz 0.5 W high linearity silicon amplifier
9.1 Scattering parameters
10. Reliability information
11. Moisture sensitivity
Table 9. Scattering parameters, MMIC only
V
CC
=5V; I
CC
=180mA; T
case
=25
°
C.
f (MHz) s
11
s
21
s
12
s
22
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
Magnitude
(ratio)
Angle
(degree)
400 0.92 178 8.64 91 0.01 45 0.75 −173
500 0.91 176 6.95 88 0.01 49 0.76 −175
600 0.91 174 5.88 86 0.01 51 0.75 −176
700 0.91 172 5.05 83 0.02 53 0.75 −178
800 0.91 170 4.47 81 0.02 55 0.74 −180
900 0.91 167 4.01 79 0.02 55 0.74 179
1000 0.90 165 3.64 76 0.02 54 0.75 177
1100 0.90 163 3.30 74 0.02 52 0.76 175
1200 0.90 161 3.0 71 0.02 51 0.75 173
1300 0.91 159 2.75 69 0.03 50 0.76 172
1400 0.91 156 2.53 67 0.03 51 0.76 171
1500 0.92 155 2.33 65 0.03 52 0.77 170
1600 0.92 153 2.16 64 0.03 52 0.77 169
1700 0.92 152 2.01 62 0.03 51 0.78 168
1800 0.92 152 1.86 61 0.03 48 0.78 168
1900 0.93 151 1.75 60 0.03 49 0.79 168
2000 0.93 152 1.64 60 0.03 51 0.80 168
2100 0.93 151 1.56 59 0.04 52 0.80 169
2200 0.93 151 1.48 58 0.04 52 0.80 169
2300 0.92 151 1.43 57 0.04 52 0.80 170
2400 0.92 151 1.38 57 0.04 52 0.79 171
2500 0.90 152 1.33 57 0.04 51 0.80 172
2600 0.90 152 1.29 56 0.04 50 0.79 173
2700 0.89 152 1.27 55 0.05 50 0.78 173
Table 10. Reliability
Life test Conditions Intrinsic failure rate
HTOL according to JESD85; confidence level 60 %; T
j
=55°C;
activation energy = 0.7 eV; acceleration factor determined
according to the Arrhenius equation.
4
Table 11. Moisture sensitivity level
Test methodology Class
JESD-22-A113 1