Datasheet

ADC1212D_SER All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 2 — 4 March 2011 34 of 42
NXP Semiconductors
ADC1212D series
Dual 12-bit ADC: CMOS or LVDS DDR digital outputs
[1] t
clk
=1/f
clk
Table 25. Output clock register (address 0012h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 4 - - 0000 not used
3 DAVINV R/W output clock data valid (DAV) polarity
0 normal
1 inverted
2 to 0 DAVPHASE[2:0] R/W DAV phase select
000 output clock shifted (ahead) by 6/16  t
clk
[1]
001 output clock shifted (ahead) by 5/16  t
clk
[1]
010 output clock shifted (ahead) by 4/16  t
clk
[1]
011 output clock shifted (ahead) by 3/16  t
clk
[1]
100 output clock shifted (ahead) by 2/16  t
clk
[1]
101 output clock shifted (ahead) by 1/16  t
clk
[1]
110 default value as defined in timing section
111 output clock shifted (delayed) by 1/16  t
clk
[1]
Table 26. Offset register (address 0013h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 6 - - 00 not used
5 to 0 DIG_OFFSET[5:0] R/W digital offset adjustment
011111 +31 LSB
... ...
000000 0
... ...
100000 32 LSB
Table 27. Test pattern register 1 (address 0014h) bit description
Default values are highlighted.
Bit Symbol Access Value Description
7 to 3 - - 00000 not used
2 to 0 TESTPAT_SEL[2:0] R/W digital test pattern select
000 off
001 mid scale
010 FS
011 +FS
100 toggle ‘1111..1111’/’0000..0000’
101 custom test pattern
110 ‘0101..0101’
111 ‘1010..1010.’