Datasheet

74LVC1G53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 9 — 5 April 2013 7 of 27
NXP Semiconductors
74LVC1G53
2-channel analog multiplexer/demultiplexer
10.1 Test circuits
10.2 ON resistance
V
I
=V
CC
or GND; V
O
= GND or V
CC
.
Fig 7. Test circuit for measuring OFF-state leakage current
V
O
I
S
001aad390
S
Z
E
Y0
Y1
V
CC
GND
switch
switch
1
1
2
2
V
IH
V
IL
S
V
IH
V
IH
E
V
I
V
IL
or V
IH
V
IH
V
I
=V
CC
or GND and V
O
= open circuit.
Fig 8. Test circuit for measuring ON-state leakage current
I
S
001aad391
S
Z
E
Y0
Y1
V
CC
GND
V
I
V
IL
or V
IH
V
IL
switch
1
2V
IH
V
IL
S
V
IL
V
IL
E
V
O
switch
1
2
Table 8. ON resistance
At recommended operating conditions; voltages are referenced to GND (ground 0 V); for graphs see Figure 10
to Figure 15.
Symbol Parameter Conditions 40 C to +85 C 40 C to +125 C Unit
Min Typ
[1]
Max Min Max
R
ON(peak)
ON resistance (peak) V
I
=GNDtoV
CC
; see Figure 9
I
SW
=4mA;
V
CC
= 1.65 V to 1.95 V
- 34.0 130 - 195 
I
SW
=8mA; V
CC
= 2.3 V to 2.7 V - 12.0 30 - 45 
I
SW
=12mA; V
CC
= 2.7 V - 10.4 25 - 38 
I
SW
=24mA; V
CC
=3Vto3.6V - 7.8 20 - 30 
I
SW
=32mA; V
CC
= 4.5 V to 5.5 V - 6.2 15 - 23 