Datasheet

74LVC1G53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 9 — 5 April 2013 15 of 27
NXP Semiconductors
74LVC1G53
2-channel analog multiplexer/demultiplexer
Adjust f
i
voltage to obtain 0 dBm level at input.
Fig 21. Test circuit for measuring isolation (OFF-state)
dB
001aad396
50 Ω
R
L
0.1 μF
S
Z
E
Y0
Y1
V
CC
0.5V
CC
0.5V
CC
GND
C
L
R
L
switch
switch
1
1
2
2
V
IL
V
IH
S
V
IH
V
IH
E
f
i
V
IL
or V
IH
V
IH
a. Test circuit
b. Input and output pulse definitions
Q
inj
= V
O
 C
L
.
V
O
= output voltage variation.
R
gen
= generator resistance.
V
gen
= generator voltage.
Fig 22. Test circuit for measuring charge injection
001aad398
S
Z
Y0
Y1
R
L
C
L
V
CC
GND
R
gen
V
gen
switch
1
2
V
I
V
O
E
V
IL
G
001aac478
ΔV
O
offonoff
logic
input
V
O
(S)