Datasheet

74LVC1G53 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2013. All rights reserved.
Product data sheet Rev. 9 — 5 April 2013 14 of 27
NXP Semiconductors
74LVC1G53
2-channel analog multiplexer/demultiplexer
11.3 Test circuits

iso
isolation (OFF-state) R
L
=50; C
L
=5pF; f
i
=10MHz;
see Figure 21
V
CC
=1.65V - 42 - dB
V
CC
=2.3V - 42 - dB
V
CC
=3.0V - 40 - dB
V
CC
=4.5V - 40 - dB
Q
inj
charge injection C
L
= 0.1 nF; V
gen
=0V; R
gen
=0;
f
i
= 1 MHz; R
L
=1M; see Figure 22
V
CC
=1.8V - 3.3 - pC
V
CC
=2.5V - 4.1 - pC
V
CC
=3.3V - 5.0 - pC
V
CC
=4.5V - 6.4 - pC
V
CC
=5.5V - 7.5 - pC
Table 12. Additional dynamic characteristics
…continued
At recommended operating conditions; voltages are referenced to GND (ground = 0 V); T
amb
=25  C.
Symbol Parameter Conditions Min Typ Max Unit
Fig 19. Test circuit for measuring total harmonic distortion
D
001aad394
600 Ω
10 μF
0.1 μF
S
Z
Y0
Y1
V
CC
0.5V
CC
GND
C
L
R
L
switch
switch
1
1
2
2
V
IH
V
IL
S
V
IL
V
IL
E
f
i
V
IL
or V
IH
E
V
IL
Adjust f
i
voltage to obtain 0 dBm level at output. Increase f
i
frequency until dB meter reads 3dB.
Fig 20. Test circuit for measuring the frequency response when switch is in ON-state
dB
001aad395
50 Ω
0.1 μF
S
Z
E
Y0
Y1
V
CC
0.5V
CC
GND
C
L
R
L
switch
switch
1
1
2
2
V
IH
V
IL
S
V
IL
V
IL
E
f
i
V
IL
or V
IH
V
IL