Datasheet

74LV4051 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2014. All rights reserved.
Product data sheet Rev. 5 — 17 September 2014 16 of 27
NXP Semiconductors
74LV4051
8-channel analog multiplexer/demultiplexer
10.2.1 Test circuits
V
CC
= 3.0 V; GND = 0 V; V
EE
=-3.0V; R
L
=50;
R
SOURCE
=1k.
Fig 16. Test circuit for measuring frequency response Fig 17. Typical frequency response
dB
001aak420
GND
f
i
2R
L
2R
L
C
L
GND = V
EE
S0 to S2
E
Z
V
IH
or V
IL
V
CC
V
CC
Yn
0.1 μF
001aak361
0
5
(dB)
−5
f (kHz)
10 10
6
10
5
10
2
10
4
10
3
V
CC
= 3.0 V; GND = 0 V; V
EE
=-3.0V; R
L
=50;
R
SOURCE
=1k.
Fig 18. Test circuit for measuring isolation (OFF-state) Fig 19. Typical isolation (OFF-state) as function of
frequency
dB
001aak421
V
CC
f
i
2R
L
2R
L
C
L
GND = V
EE
S0 to S2
E
Z
V
IH
or V
IL
V
CC
V
CC
Yn
0.1 μF
001aak360
−50
0
(dB)
−100
f (kHz)
10 10
6
10
5
10
2
10
4
10
3