Datasheet

74HC_HCT157 All information provided in this document is subject to legal disclaimers. © NXP Semiconductors N.V. 2015. All rights reserved.
Product data sheet Rev. 7 — 21 January 2015 10 of 19
NXP Semiconductors
74HC157; 74HCT157
Quad 2-input multiplexer
Test data is given in Table 9.
Definitions test circuit:
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including jig and probe capacitance.
R
L
= Load resistance.
S1 = Test selection switch.
Fig 9. Test circuit for measuring switching times
DDK

W
:
W
:
W
U
W
U
W
I
9
0
9
,
QHJDWLYH
SXOVH
*1'
9
,
SRVLWLYH
SXOVH
*1'




9
0
9
0
9
0
W
I
9
&&
'87
5
7
9
,
9
2
&
/
*
Table 9. Test data
Type Input Load Test
V
I
t
r
, t
f
C
L
74HC157 V
CC
6.0 ns 15 pF, 50 pF t
PLH
, t
PHL
74HCT157 3.0 V 6.0 ns 15 pF, 50 pF t
PLH
, t
PHL