Datasheet

74HC_HCT00 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2011. All rights reserved.
Product data sheet Rev. 6 — 14 December 2011 7 of 16
NXP Semiconductors
74HC00; 74HCT00
Quad 2-input NAND gate
Test data is given in Table 9.
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
Fig 7. Load circuitry for measuring switching times
001aah768
t
W
t
W
t
r
t
r
t
f
V
M
V
I
negative
pulse
GND
V
I
positive
pulse
GND
10 %
90 %
90 %
10 %
V
M
V
M
V
M
t
f
V
CC
DUT
R
T
V
I
V
O
C
L
G
Table 9. Test data
Type Input Load Test
V
I
t
r
, t
f
C
L
74HC00 V
CC
6.0 ns 15 pF, 50 pF t
PLH
, t
PHL
74HCT00 3.0 V 6.0 ns 15 pF, 50 pF t
PLH
, t
PHL