Datasheet

74HC_HCT74 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 4 — 27 August 2012 12 of 21
NXP Semiconductors
74HC74; 74HCT74
Dual D-type flip-flop with set and reset; positive edge-trigger
Test data is given in Table 10.
Definitions test circuit:
R
T
= Termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= Load capacitance including jig and probe capacitance.
R
L
= Load resistance.
S1 = Test selection switch.
Fig 9. Test circuit for measuring switching times
001aah768
t
W
t
W
t
r
t
r
t
f
V
M
V
I
negative
pulse
GND
V
I
positive
pulse
GND
10 %
90 %
90 %
10 %
V
M
V
M
V
M
t
f
V
CC
DUT
R
T
V
I
V
O
C
L
G
Table 10. Test data
Type Input Load Test
V
I
t
r
, t
f
C
L
R
L
74HC74 V
CC
6ns 15pF, 50 pF 1k t
PLH
, t
PHL
74HCT74 3V 6ns 15pF, 50 pF 1k t
PLH
, t
PHL