Datasheet

74HC_HCT132 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2012. All rights reserved.
Product data sheet Rev. 3 — 30 August 2012 7 of 20
NXP Semiconductors
74HC132; 74HCT132
Quad 2-input NAND Schmitt trigger
12. Waveforms
Measurement points are given in Table 8.
V
OL
and V
OH
are typical voltage output levels that occur with the output load.
Fig 5. Input to output propagation delays
001aai814
nA, nB input
V
I
GND
V
OH
V
OL
nY output
t
THL
t
TLH
V
M
V
M
V
X
V
Y
t
PHL
t
PLH
Table 8. Measurement points
Type Input Output
V
M
V
M
V
X
V
Y
74HC132 0.5V
CC
0.5V
CC
0.1V
CC
0.9V
CC
74HCT132 1.3 V 1.3 V 0.1V
CC
0.9V
CC
Test data is given in Table 9.
Definitions test circuit:
R
T
= termination resistance should be equal to output impedance Z
o
of the pulse generator.
C
L
= load capacitance including jig and probe capacitance.
Fig 6. Load circuitry for measuring switching times
001aah768
t
W
t
W
t
r
t
r
t
f
V
M
V
I
negative
pulse
GND
V
I
positive
pulse
GND
10 %
90 %
90 %
10 %
V
M
V
M
V
M
t
f
V
CC
DUT
R
T
V
I
V
O
C
L
G