User manual

262
Specifications
Residual
noise in [dB]
@ S =
42 mV/Pa
of XL2
without
measure-
ment
microphone
Frequency weighting A
Level range L
eq
L
peak
LOW 4 17
MID 18 31
HIGH 43 55
Frequency weighting C
Level range L
eq
L
peak
LOW 3 16
MID 17 30
HIGH 41 55
Frequency weighting Z
Level range L
eq
L
peak
LOW 7 20
MID 21 34
HIGH 46 58
Measure-
ments
SPL actual, Lmin, Lmax, Lpeak, Leq
Gliding LAeq and LCeq with selectable time win-
dow from one second to one hour
(=running Lxeq or sliding Lxeq with x= A or C)
All measurement results simultaneously available
Correction value measurement wizard based on
LAeq, LCeq and LCpeak
Noise exposure level LEX with post-processing
Logging all data or subsets in selectable intervals
Recording of voice notes
Monitoring of sound levels that exceed limits
Digital I/O interface for external peripherals control
Real-Time
Analyzer
RTA
Conforms with class 1 of IEC 61260:2014 and
ANSI S1.11-2014
1/1 octave band display: 8 Hz - 16 kHz
sub ranges 8 Hz - 4 kHz or 31.5 Hz - 16 kHz
displayed with A/Z broadband levels at one glance
1/3 octave band display: 6.3 Hz - 20 kHz
sub ranges 6.3 Hz - 8 kHz or 20 Hz - 20 kHz
displayed with A/Z broadband levels at a glance
Level resolution: 0.1 dB
Measurement Units: Volt, dBu, dBV and dBSPL
Band pass filters (base 10) conform with class 1 of
IEC 61260:2014 and ANSI S1.11-2014
1/1 octave spectrum: > 16 Hz band »
1/3 octave spectrum: > 16 Hz band »
Wide band levels simultaneously
Frequency weighting: X-Curve @ 500 seats in ac-
cordance with SMPTE ST 202:2010 and
ISO 2969:2015
Capturing of a single reading into the internal
memory for comparative measurements
Leq logging