User Guide

Nokia Customer Care Schematics 1CJ_08 RH-47
Company Confidential
Issue 1 05/04 © 2004 Nokia Corporation Page 8-8
MMC card interface diagram, v.0.0 ed.13
Testpads for ATE
CMD
4341761
CLK
DATA0
Testpads will
Components:470-499
4129101
4129071
Reset
GND
VSIM
Data
SIMDATA
Clock
"DCT3" SIM READER
be removed in final
VSIM GND
SIMRST
SIMCLK
DATA3
CMD
CLK
DATA0
5400339
Testpads for Production
TEST Point for ATE SIM-GND
J490
J488
close to SIM connector
GND
X471
1
2
3
4
5
6
7
8
9
2.8V
0V
196KHz
REF479
2.8V
0V
VBat
REF480
VBAT_SMPS
REF477
2.85V
REF478
X469
1
2
3
5
6
7
VIO
GND
J497
15
C707_10M006_531_2
4
J492
J472
C1
LatchClk
C2
Dir3
C3
C4
A1
B2
D1
B3
D2
A3
D3
A2
D4
A1
VBAT
EN2
A2
GND
A3
EN1
A4
B1
VCCB
B2
Dir2
B3
Dir1
VCCA
B4
B1
VMMC
J471
N470
LP3928TLX-1828_NOPB
J474
J477
2
GND
GND
0
10n
C471
1
VMMC
GND
J493
GND
1u0
2p7
C477
0
1
2
3
C472
J476
C475
1u0 1u0
C474
GND
GND
VSIM
R1
R3
R2
R473
R4
R20
EMIF04-MMC02F2
R10
J473
GND GND
100n
C473
2p7
C476
J470
VMMC
J495
22nH
GND
0V
3.0V
REF472
3.0V
REF473
2.85V
REF475
REF476
1.8V
L470
J487
3.25MHz
0V
3.0V
REF470
0V
3.0V
REF471
CLK
GND
CLK
GND
GND
3
VIO
R1
R3
R2
EMIF03-SIM01F2
R470
VSIM
12
GND
GND
22p
C492
GND
GND
GND
J475
C470
100n
SIMIF(3:0)
I_MMCIF(4:0)
GENIO(31:0)