User Guide

PAMS
Technical Documentation
RAE-3
8. Troubleshooting
Page 8 – 54
Issue 1 06/01
Test
OK?
Switch
OK ?
Ref
Memory card
cover switch
fault tree
A faulty Memory Card used before ?
SW corruption ?
Clk OK ?
Check X001/4
Measure N103/1
(control from
MAD while
re–running the
test
Check X001/2
R005, R002
V001/3
Check X001/5
R004 and
V001/4
Check X001/7
R001, R003
and V001/6
Parts OK?
Ctrl
OK?
Check
N103
C114
C123
R007
C001
Assembled device
Disassembled device in jig
Memory card
interface check
YES
NO
YES
NO
OK?
C124
2.9 – 3.1V ?
NO
YES
NO
YES
YES
YES
YES
YES
YES
YES
NO
NO
NO
CMD OK ?
Run WinTesla
Memory card
test
Run Memory Card
cover Switch
fault test
Measure VMMC
J104 while re–running
the MemCard test
Measure MMCClk
J105 while re–running
the test
Measure MMCCmd
J102 while
re–running the test
Measure MMCDa J107
Data OK?
Parts OK ?
MAD I/OUndefined CPU error
MAD I/O
fault
fault
Figure 40.