User Guide

NSD-5
10. Troubleshooting PAMS Technical Documentation
Page 46 Nokia Corporation Issue 1 05/02
Rx VHF LO Measured at RIF Pin 20 with a Hi Z Probe
RX Troubleshooting Flowchart
Test Points
Signal Name General Characteristics General Signal Destination
AFC VCTCXO control voltage PDM from MAD4
VR1 2.7V supply to VCTCXO CCONT to VCTCXO
19.2MHz 19.2MHz from VCTCXO buffer VCTCXO buffer to CAFE and PLL IC’s
TX_LIM_ADJ Detector demand voltage PDM from MAD4 Pin 128 deector
circuit at RF output
1900 MHz PA Output RF output from PA check for short
with phone switched OFF
RF output from PA
Start
End
See Baseband
troubleshooting
processor
See synthesize
troubleshooting
processor
See synthesize
troubleshooting
processor
Replace N730 Replace N730
>2.0V
>-10dBm
Check the N730 Pin D1
Measure VHF_LO Power level
at N730 Pin D6
Count Value
charged by RF_RX
level charging
Replace N701
>-10dBmCheck the RX_Count by WinTesla
128.1 MHz
Measure the Freq. of N701
Pin6
>-10dB
Measure the RF signal power gain
between V701 pin 1 and pin 3
Check the voltage at V701
Pin3 is>2.0V & Replace V701
Measure UHF_LO Power level at
N701 Pin4
No
No No
No
No
No
No
Yes
Yes
Yes
Yes
Yes
Yes